Semiconductors

Semiconductors

Visualization of multilayer structures

As illustrated in this example of an organic photovoltaic cell, multilayer structures can be measured and analysed with OCT (Optical Coherence Tomography). Organic PV-cells consist of organic semiconducting materials, transparent electrodes, and a protective coating. As a result of this, a homogeneous layer structure without defects, inclusions etc. is relevant for the quality, functionality, and long-lasting performance of the product.

Characterization of thin-film structures

Laser Ultrasonics allows a very efficient characterization of thin-film structures. High-frequency ultrasonic waves (SAW) are excited up to 1 GHz by laser pulses. The layer systems are characterized by analysing the dispersion behaviour of the waves. Ask our LUS experts!

Spatially resolved spectroscopy

Do you want to know the exact local distribution (in micrometer range) of your chemical components? With Mid-Infrared-Microscopy we can chemically characterize and measure materials and cross-sections (e.g. residues or inclusions) with a spatial resolution as small as 5 µm.